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Atomic structural variations of [0 0 0 1]-tilt grain boundaries during ZnO grain growth occurred by thermal treatments |
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| Authors: | J.M. YukJ.Y. Lee Zonghoon LeeY.S. No T.W. Kim J.Y. KimW.K. Choi |
| Affiliation: | a Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea b National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA c National Research Laboratory for Nano Quantum Electronics Devices, Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791, Republic of Korea d Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Republic of Korea e Thin Film Materials Research Center, Korea Institute of Science and Technology, Seoul 136-791, Republic of Korea |
| Abstract: | |
| Keywords: | 68.37.Lp 68.56.Hp |
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