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Room temperature transparent conducting oxides based on zinc oxide thin films
Authors:J ClatotG Campet  A ZeinertC Labrugère  A Rougier
Institution:a Laboratoire de Réactivité et de Chimie des Solides, UMR CNRS 6007, 33, rue Saint-Leu, 80039 Amiens, France
b Institut de Chimie de la Matière Condensée de Bordeaux (ICMCB), CNRS, 87 Avenue du Docteur A. Schweitzer, 33608 Pessac Cedex, France
c Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue St. Leu, 80039, Amiens, France
Abstract:Doped zinc oxide thin films are grown on glass substrate at room temperature under oxygen atmosphere, using pulsed laser deposition (PLD). O2 pressure below 1 Pa leads to conductive films. A careful characterization of the film stoichiometry and microstructure using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) concludes on a decrease in crystallinity with Al and Ga additions (≤3%). The progressive loss of the (0 0 2) orientation is associated with a variation of the c parameter value as a function of the film thickness and substrate nature. ZnO:Al and ZnO:Ga thin films show a high optical transmittance (>80%) with an increase in band gap from 3.27 eV (pure ZnO) to 3.88 eV and 3.61 eV for Al and Ga doping, respectively. Optical carrier concentration, optical mobility and optical resistivity are deduced from simulation of the optical data.
Keywords:Pulsed laser deposition  Transparent conducting oxide  Zinc oxide  Optical properties  Simulation
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