Effect of molecular structure on bias stress effect in organic thin-film transistors |
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Authors: | A.K. Diallo,F. FagesF. Serein-Spirau,J.-P. Lè re-porteC. Videlot-Ackermann |
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Affiliation: | a Centre Interdisciplinaire de Nanoscience de Marseille (CINaM), CNRS UPR 3118, Campus Luminy, Aix Marseille Université, Case 913, 13288 Marseille Cedex 09, France b Equipe Architectures Moléculaires et Matériaux Nanostructurés, UMR CNRS 5253, Institut Charles Gerhardt, Ecole Nationale Supérieure de Chimie de Montpellier, 8 rue de l’Ecole Normale, 34293 Montpellier Cedex 05, France c Laboratoire de Chimie et Physique des Matériaux (LCPM), Université de Ziguinchor, Senegal |
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Abstract: | Two thiophene-phenylene semiconductors, bis(2-phenylethynyl) end-substituted oligothiophenes (diPhAc-nTs, n = 2, 3), were studied as active layers in organic thin film transistors (OTFTs). Structural and electrical properties of such high vacuum evaporated thin films were compared to pentacene. All three oligomers behave as p-type semiconducting layers into OTFTs. In the same preparation and measurement conditions, diPhAc-3T possesses two of incontrovertible attributes of OTFTs for low cost applications, a high air-stable mobility at low substrate temperature (Tsub), i.e. typically 25 °C together with a reduced bias stress effect compared to the well-known pentacene semiconductor. This study brings to light on the role of the molecular structure involved in the active layer in thin-film devices and describes effects as thin film morphology as important parameters when optimizing the structure of OTFTs. |
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Keywords: | Oligomers Thin films Transistors Bias stress effect |
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