| 测定纳米晶粒尺寸分布的新方法及其应用 |
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| 引用本文： | 古堂生,石舜森,林光明.测定纳米晶粒尺寸分布的新方法及其应用[J].物理学报,1999,48(2):267-272. |
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| 作者姓名： | 古堂生 石舜森 林光明 |
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| 作者单位： | 中山大学物理系，广州 510275 |
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| 摘 要： | 介绍了一种测定纳米晶粒尺寸分布的新方法——X射线衍射谱峰形拟合法，阐述了其理论模型和基本假设，应用它对化学法制备的纳米SnO2的晶粒分布进行了分析，得出较理想的结果，并对此法进行了技术评估.
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| 关 键 词： | X射线衍射光谱 纳米晶 晶粒尺寸分布 测量法 |
| 收稿时间： | 1998-05-25 |
A NEW METHOD TO DETERMINE THE SIZE DISTRIBUTION OF NANOCRYSTALLINE GRAINS AND ITS APPLICATION |
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| GU TANG-SHENG,SHI SHUN-SEN and LIN GUANG-MING.A NEW METHOD TO DETERMINE THE SIZE DISTRIBUTION OF NANOCRYSTALLINE GRAINS AND ITS APPLICATION[J].Acta Physica Sinica,1999,48(2):267-272. |
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| Authors: | GU TANG-SHENG SHI SHUN-SEN and LIN GUANG-MING |
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| Abstract: | A new method,Profile-fitting of X-ray diffraction spectroscopy (PFXDS) method,which was adopted to determine the size distribution of nanocrystalline grains,was introduced in this paper.Its theoretical model and basic hypothesis were clearly interpreted and its advantages and disadvantages were discussed in details.The PFXDS method was applied to the size distribution calculation of nano-SnO2 powder produced by sol-gel technology and the relatively ideal results were obtained. |
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