| 样品表面层有微观应变梯度时Warren-Averbach方法的修正 |
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| 引用本文： | 杨柳,姚鸿年.样品表面层有微观应变梯度时Warren-Averbach方法的修正[J].物理学报,1989,38(6):991-994. |
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| 作者姓名： | 杨柳 姚鸿年 |
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| 作者单位： | 浙江大学 |
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| 摘 要： | 本文讨论了样品表面层有微观应变梯度时X射线衍射线形分析的方法.设样品表面层微观应变随深度t的变化满足关系式<εL2>=∑am(L)tm,从而改进了Warren-Averbacb方法,使之可以应用到表面层存在微观应变梯度的情形.若<εL2>=a0(L)+a1(L)t,则分析二种波长不同的X射线同一衍射方向的衍射线形,可以得到微观应变随深度的变化规律.
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| 关 键 词： | 晶体学 形变多晶材料 W－A方法 |
| 收稿时间： | 1987-12-24 |
A MODIFIED WARREN-AVERBACH METHOD FOR THE SAMPLE WITH A MICRO-STRAIN GRADIENT IN ITS SURFACE LAYER |
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| YANG LIU and YAO HONG-NIAN.A MODIFIED WARREN-AVERBACH METHOD FOR THE SAMPLE WITH A MICRO-STRAIN GRADIENT IN ITS SURFACE LAYER[J].Acta Physica Sinica,1989,38(6):991-994. |
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| Authors: | YANG LIU and YAO HONG-NIAN |
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| Abstract: | This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer. On the assumption that the variation of micro-strain <εL2> with depth t is expressed as <εL2>-Σam(L)tm, Warren-Averbach method is modified so that it can be used in this case. For the special case of <εL2>=α0+a1(L)t, the relationship between the micro-strain <εL2> and the depth t can be determined by analyses of diffraction profiles belonging to two different radiations. |
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