Ray tracing on extended hemispherical and elliptical silicon dielectric lenses |
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Authors: | W. B. Dou and Z. L. Sun |
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Affiliation: | (1) State Key Laboratory of Millimeter Waves Department of Radio Engineering, Southeast University, 210096 Nanjing, People's Republic of China |
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Abstract: | ![]() In this paper, extended hemispherical and elliptical silicon dielectric lenses are compared by means of ray tracing. It is shown that the optical focuses of two lenses are not at same position though the elliptical lens is synthesized from an extended hemispherical lens by carefully choosing a particular extension length as stated in ref[1]. It may be used to explain why the best compromise between alignment, directivity and Gaussian-coupling effciency will be obtained if the feed antenna is placed at the region between 2.2 mm and 2.4 mm of extension length (for 13.7 mm diameter lens, dielectric contant = 11.7). |
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Keywords: | Millimeter Waves Quasi-optical Techniques Dielectric lens |
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