Atomic-Scale Structure of Water-Based Zirconia Xerogels by X-Ray Diffraction

The structural evolution of zirconia thin films and gel powders has been evaluated by X-ray diffraction. Maxima (r ₁ and r ₂) of the experimental radial distribution function RDF and the bond angles were determined and correlated with TGA (thermogravimetric analysis), DTA (differential thermal analysis) and MS (mass spectrometry). The results indicate that the topological short-range structure (<5 Å) of amorphous zirconia thin films, independent of drying temperature, resembles that of crystalline tetragonal ZrO₂. In contrast, amorphous zirconia powder gels dried at temperatures below 120°C show atomic arrangements similar to that of tetragonal ZrO₂. The structure of these gels annealed at temperatures between 165–340°C resembles a distorted tetragonal ZrO₂, monoclinic-like structure. Zirconia powders and films contain crystalline tetragonal ZrO₂ at 400°C.