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Green electroluminescence from an n-ZnO: Er/p-Si heterostructured light-emitting diode
Authors:S. Iwan  S. Bambang  J.L. Zhao  S.T. Tan  H.M. Fan  L. Sun  S. Zhang  H.H. Ryu  X.W. Sun
Affiliation:1. Jurusan Fisika, FMIPA, FMIPA Universitas Negeri Jakarta, Jl. Pemuda No. 10 Rawamangun, Jakarta 13220, Indonesia;2. PPS Ilmu Material, FMIPA, Universitas Indonesia, Jl. Salemba Raya No. 4, Jakarta 10430, Indonesia;3. School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore;4. Department of Physics, National University of Singapore, Blk S12, 2 Science Drive 3, Singapore 117542, Singapore;5. School of Mechanical and Aerospace Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore;6. School of Nano Engineering, Inje University, 607 Obang-dong, Gimhae, Gyeongnam, South Korea 621-749
Abstract:
Erbium-doped ZnO (ZnO:Er) thin films with various doping concentrations were deposited on p-Si substrates by ultrasonic spray pyrolysis (USP). The n-ZnO:Er/p-Si heterojunctions were further employed to fabricate light-emitting diodes (LEDs). The devices showed diode-like rectifying current–voltage characteristics with a low reverse breakdown voltage, attributed to the avalanche breakdown. A distinct green electroluminescence peaking at 537 nm and 558 nm were observed at room temperature under reverse bias. The green electroluminescence originated from the electron impact excitation of Er3+ ions doped in ZnO films.
Keywords:ZnO:Er   USP   n-ZnO:Er/p-Si heterojunctions   Room temperature   Photoluminescence   Electron impact excitation
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