A speckle-shearing interferometer: A tool for measuring derivatives of surface displacements |
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| Authors: | Yau Y. Hung |
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| Affiliation: | IIT Research Institute, 10 West 35th Street, Chicago, Illinois 60616, USA |
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| Abstract: | A speckle-shearing interferometer is developed using a sheared Michelson interferometer. The tool, like speckle interferometry, utilizes the speckle effect of coherent light. However, while speckle interferometry measures surface displacements, the speckle-shearing interferometer determines the derivatives of the surface displacements. Hence, it eliminates the necessity of differentiating the measured displacements to obtain strain. |
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| Keywords: | Author to whom correspondence should be addressed. |
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