| 单片机控制数字光强检测计的设计 |
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| 引用本文： | 陈磊,张凯,杨义军.单片机控制数字光强检测计的设计[J].大学物理实验,2009,22(4):37-40. |
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| 作者姓名： | 陈磊 张凯 杨义军 |
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| 作者单位： | 扬州大学,扬州,225002 |
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| 摘 要： | 数字光强检测计利用光电池测量光强相对变化,用AT89S52单片机控制高精度AD对光电池电压进行测量,测量结果存储在E2PROM中,并在液晶屏上显示。全部测量结束后可自动对数据进行计算、处理。本仪器操作简单,精度高,己应用在单缝衍射实验、偏振光实验、双缝干涉实验等实验中。
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| 关 键 词： | 光强检测 光学实验 单片机 |
The Design of Digital Light-Intensity Detector Controlled by MCU |
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| CHEN Lei,ZHANG Kai,YANG Yi-jun.The Design of Digital Light-Intensity Detector Controlled by MCU[J].Physical Experiment of College,2009,22(4):37-40. |
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| Authors: | CHEN Lei ZHANG Kai YANG Yi-jun |
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| Institution: | CHEN Lei,ZHANG Kai, YANG Yi - jun (YangZhou University, Yangzhou 225002) |
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| Abstract: | The digital light-intensity detector uses MCU AT89S52 to control high-precision ADC to measure voltage,which is converted by photocell.Then the data is stored in the E2PROM and showed on liquid crystal display.At end of the experiment the data can be normalized,which can help to validate the relevant theory.The high-precision detector is easy to operate.It has been applied in the single-slit diffraction experiment,polarized light experiment,double-slit interference experiment,etc. |
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| Keywords: | light intensity detection optical experiment MCU |
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