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Spectroscopic analysis of electromigration at gold nanojunctions
Institution:1. Institute of Industrial Science and INQIE, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan;2. CREST-JST, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan;1. Institute of Physics, University of Tartu, 50411 Tartu, Estonia;2. Skobeltsyn Institute of Nuclear Physics, Moscow State University, 119991 Moscow, Russia;3. Nikolaev Institute of Inorganic Chemistry, SB RAS, Novosibirsk 630090, Russia;4. Sobolev Institute of Geology and Mineralogy, SB RAS, Novosibirsk 630090, Russia;5. Institute of Light and Matter, CNRS, University Lyon1, Villeurbanne 69622, France;1. Department of Physics, Faculty of Science, Taif University, Taif 888, Saudi Arabia;2. Department of Physics, Faculty of Education, Ain Shams University, Roxy, Cairo 11757, Egypt;3. Department of Physics, Faculty of Science, Sohag University, Sohag 82524, Egypt;4. Department of Physics, Faculty of Science and Humanity Studies at Al-Quwayiyah, Shaqra University, Al-Quwayiyah 11971, Saudi Arabia;1. Lobachevsky State University of Nizhny Novgorod, 23/3 Gagarin prospect, Nizhny Novgorod, 603950, Russia;2. Sedakov Scientific-Research Institute, GSP-486, Nizhny Novgorod 603950, Russia;1. Applied Physics Division, Bhabha Atomic Research Centre, Mumbai 400085, India;2. Laser and Plasma Technology Division, Bhabha Atomic Research Centre, Mumbai 400085, India;3. Materials Processing Division, Bhabha Atomic Research Centre, Mumbai 400085, India;1. Department of Electronics and Communication Engineering, Thapar University, Patiala, India;2. Department of Civil Engineering, Thapar University, Patiala, India;1. Institute of Solid State Chemistry, Ural Branch of the Russian Academy of Sciences, 620990 Ekaterinburg, Russia;2. Ural Federal University, 620002 Ekaterinburg, Russia;3. Juelich Centre for Neutron Science and Institute for Complex Systems, Forschungszentrum Juelich GmbH, ICS-JCNS, 52425 Juelich, Germany;4. Research Neutron Source Heinz Maier-Leibnitz, FRM II, 85747 Garching, Germany;5. Crystallography and Structural Physics, University of Erlangen-Nuremberg, 91058 Erlangen, Germany
Abstract:We have investigated the electromigration process at gold nanojunctions by introducing a novel spectroscopic approach. When the junction voltage exceeded certain critical values, conductance showed successive drops by one quantum conductance, corresponding to one-by-one removal of gold atoms. The observed critical voltages agree with the activation energies for surface diffusion of gold atoms. This fact clearly indicates that the elementary process of electromigration is the self-diffusion of metal atoms driven by microscopic kinetic energy transfer from a single conduction electron to a single metal atom. This new finding can be applied to reproducible formation of atomic-spacing gaps for single molecular junctions and also to the failure-tolerant interconnects for VLSIs.
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