Variable magnetic field and temperature magnetic force microscopy |
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| Authors: | J Mohanty R Engel-Herbert T Hesjedal |
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| Institution: | (1) Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5–7, 10117 Berlin, Germany |
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| Abstract: | Magnetic force microscopy (MFM) studies of epitaxial MnAs films on GaAs(001) have been performed as a function of the applied magnetic field and the sample temperature. For this purpose, we combined a stable variable-temperature sample stage with a compact magnet assembly to fit a commercial magnetic force microscope. In order to keep the thermal drift that affects MFM measurements low, we employed a permanent magnet that can be rotated in a yoke assembly guiding the magnetic flux to the sample. PACS 68.37.Rt; 68.35.Rh; 75.70.-i; 75.70.Kw |
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