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Engineering and metrology of epitaxial graphene
Authors:Alexander Tzalenchuk,Samuel Lara-Avila,Mikael Syvä    rvi,Olga Kazakova,Kasper Moth-Poulsen,Sergey Kopylov,Sergey Kubatkin
Affiliation:
  • a National Physical Laboratory, Teddington TW11 0LW, UK
  • b Department of Microtechnology and Nanoscience, Chalmers University of Technology, S-412 96 Göteborg, Sweden
  • c Department of Physics, Chemistry and Biology (IFM), Linköping University, S-581 83 Linköping, Sweden
  • d College of Chemistry, University of California, Berkeley, 637 Latimer Hall, Berkeley, CA 94720, USA
  • e Nano-Science Center & Department of Chemistry, University of Copenhagen, Universitetsparken 5, DK-2100, Denmark
  • f Physics Department, Lancaster University, Lancaster LA1 4YB, UK
  • Abstract:
    Here we review the concepts and technologies, in particular photochemical gating, which contributed to the recent progress in quantum Hall resistance metrology based on large scale epitaxial graphene on silicon carbide.
    Keywords:A. Graphene   D. Quantum Hall effect   D. Photochemical gate   E. Metrology
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