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Spin domain mapping of a CrO2 thin film using spin-polarized current microscopy
Authors:JY Son  JH Cho  Y-H Shin
Institution:
  • a Department of Applied Physics, College of Applied Science, Kyung Hee University, Suwon 446-701, South Korea
  • b Research Center for Dielectric and Advanced Matter Physics (RCDAMP), Pusan National University, Pusan 609-735, South Korea
  • c Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, South Korea
  • d Departments of Physics, Chemistry and EHSRC, University of Ulsan, Ulsan 680-749, South Korea
  • Abstract:We investigate spin domain mapping of a CrO2 thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO2-coated tip is used. The nanoscale spin domains of the CrO2 thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO2 thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO2-coated tip and surface of the CrO2 thin film.
    Keywords:A  Magnetic films and multilayers  B  Chemical synthesis  D  Tunneling
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