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Molecular mass concentrations for a powdered SRM sample using a quantitative single particle analysis
Authors:Khan M S I  Hwang H  Kim H  Ro Chul-Un
Institution:Department of Chemistry, Inha University, Incheon 402-751, Republic of Korea
Abstract:In a quantitative single particle analysis, named the low-Z particle EPMA, number concentration data for chemical species encountered in aerosol sample are provided. However, it will be more useful if mass concentration data can be obtained from single particle analysis; i.e., the single particle analysis data for weight fractions of chemical species can be complementarily used in combination with the bulk analysis data, for more clearly understanding the behavior of airborne aerosols. In order to investigate how reliably mass concentration data can be obtained from the low-Z particle EPMA technique, a potassium feldspar powdered standard reference material (SRM), of which elemental weight fractions are well defined by various bulk analytical techniques, was analyzed using the low-Z particle EPMA technique. In this work, it is demonstrated that weight fractions of major elements in the powdered SRM sample obtained by the low-Z particle EPMA are within 8% to the certified values obtained by bulk analytical techniques, although the single particle and bulk analyses employ different approaches. Further, it is shown that the quantitative single particle analysis, i.e., low-Z particle EPMA, can provide molecular mass concentration data for chemical species, which is not easy to obtain using bulk analysis.
Keywords:Single particle analysis  Energy dispersive-electron probe X-ray microanalysis  Low-Z particle electron probe X-ray microanalysis  Potassium-feldspar  Standard reference material
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