Constant-distance mode scanning electrochemical microscopy (SECM)--Part I: Adaptation of a non-optical shear-force-based positioning mode for SECM tips

A non-optical shear-force-based detection scheme for accurately controlling the tip-to-sample distance in scanning electrochemical microscopy (SECM) is presented. With this approach, the detection of the shear force is accomplished by mechanically attaching a set of two piezoelectric plates to the scanning probe. One of the plates is used to excite the SECM tip causing it to resonate, and the other acts as a piezoelectric detector of the amplitude of the tip oscillation. Increasing shear forces in close proximity to the sample surface lead to a damping of the vibration amplitude and a phase shift, effects that are registered by connecting the detecting piezoelectric plate to a dual-phase analogue lock-in amplifier. The shear force and hence distance-dependent signal of the lock-in amplifier is used to establish an efficient, computer-controlled closed feedback loop enabling SECM imaging in a constant-distance mode of operation. The details of the SECM setup with an integrated piezoelectric shear-force distance control are described, and approach curves are shown. The performance of the constant-distance mode SECM with a non-optical detection of shear forces is illustrated by imaging simultaneously the topography and conductivity of an array of Pt-band microelectrodes.