Field dependent critical fluctuations aboveT g in the ESR line width of the spin glassAgMn |
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Authors: | H. Mahdjour C. Pappa R. Wendler K. Baberschke |
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Affiliation: | (1) Institut für Atom- und Festkörperphysik, Freie Universität Berlin, Arnimallee 14, D-1000 Berlin 33, Germany;(2) Present address: Études et fabrication, Dowell Schlumberger, BP90, F-42003 St. Etienne, France |
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Abstract: | The ESR of the spin glassAgMn (2.7 and 9.6 at %) has been investigated below and aboveTg(0.1Tg<T<5Tg) at various microwave frequencies. The analysis yields:1) No explicit frequency dependence but strong magnetic field effects, inherent with ESR-experiments.2) Part of the excess line width is identified as critical spin fluctuations, following a power law. However, because of the presence of the applied field, the reduced temperaturet is not a good scaling variable. We choose the non-linear susceptibility Xs divided byH2, which scales as the order parameter susceptibility. The experiment yieldsWex(Xs/H2)p,p=0.42. From this we deduce z3. |
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