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Spectroscopy and imaging of metal-organic interfaces using BEEM |
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| Authors: | Linda Kunardi N. Chandrasekhar |
| Affiliation: | a Institute of Materials Research and Engineering (IMRE), 3 Research Link, Singapore 117602, Singapore b Department of Physics, National University of Singapore (NUS), Science Drive 3, Singapore 117542, Singapore |
| Abstract: | Charge injection from metal electrodes to organics is a subject of intense scientific investigation for organic electronics. Ballistic electron emission microscopy (BEEM) enables spectroscopy and imaging of buried interfaces with nanometer resolution. Spatial non-uniformity of carrier injection is observed for both Ag-PPP (poly-paraphenylene) and Ag-MEHPPV (poly-2-methoxy-5-2-ethyl-hexyloxy-1,4-phenylenevinylene) interfaces. BEEM current images are found to correlate only marginally with the surface topography of the Ag film. |
| Keywords: | 73.20.-r 73.40.-c 73.40.Ns |
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