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Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies |
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| Authors: | G. Brauer W. Anwand W. Skorupa C. Teichert J. Cizek P.G. Coleman A. Kohyama |
| Affiliation: | a Institut für Ionenstrahlphysik und Materialforschung, Forschungszentrum Rossendorf e.V., PF 510119, D-01314 Dresden, Germany b Institut für Physik, Montanuniversität Leoben, Franz Josef Str. 18, A-8700 Leoben, Austria c Department of Low Temperature Physics, Faculty of Mathematics and Physics, Charles University, V Holesovickach 2, CZ-180 00 Prague, Czech Republic d Department of Physics, University of Bath, Bath BA2 7 AY, UK e Metals and Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, MS6151, Oak Ridge, TN 37831-6151, USA f Institute of Advanced Energy, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan |
| Abstract: | A SiC/SiC composite is characterized by X-ray diffraction, atomic force microscopy and various positron spectroscopies (slow positron implantation, positron lifetime and re-emission). It is found that besides its main constituent 3C-SiC the composite still must contain some graphite. In order to better interpret the experimental findings of the composite, a pyrolytic graphite sample was also investigated by slow positron implantation and positron lifetime spectroscopies. In addition, theoretical calculations of positron properties of graphite are presented. |
| Keywords: | SiC/SiC composite Graphite X-ray diffraction Atomic force microscopy Slow positron spectroscopy Positron lifetime Positron affinity Positron re-emission |
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