The refractive nonlinearities of InAs/GaAs quantum dots above-bandgap energy |
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Authors: | X. Huang Y.G. Zhu T. Li L.F. Han X.J. Shang H.Q. Ni Z.C. Niu |
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Affiliation: | State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China |
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Abstract: | The third-order optical nonlinear refractive properties of InAs/GaAs quantum dots grown by molecular beam epitaxy have been measured using the reflection Z-scan technique at above-bandgap energy. The nonlinear refractive index and nonlinear absorption index of the InAs/GaAs quantum dots were determined for wavelengths from 740 to 777 nm. The measured results are compared with the nonlinear refractive response of several typical III-V group semiconductor materials. The corresponding mechanisms responsible for the large nonlinear response are discussed. |
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Keywords: | InAs quantum dots Nonlinear refraction Reflection Z-scan |
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