Implementation of a beam deflection system for studies of liquid interfaces on beamline I07 at Diamond

X‐ray optics, based on a double‐crystal deflection scheme, that enable reflectivity measurements from liquid surfaces/interfaces have been designed, built and commissioned on beamline I07 at Diamond Light Source. This system is able to deflect the beam onto a fixed sample position located at the centre of a five‐circle diffractometer. Thus the incident angle can be easily varied without moving the sample, and the reflected beam is tracked either by a moving Pilatus 100K detector mounted on the diffractometer arm or by a stationary Pilatus 2M detector positioned appropriately for small‐angle scattering. Thus the system can easily combine measurements of the reflectivity from liquid interfaces (Q_z > 1 Å^?1) with off‐specular data collection, both in the form of grazing‐incidence small‐angle X‐ray scattering (GISAXS) or wider‐angle grazing‐incidence X‐ray diffraction (GIXD). The device allows operation over the energy range 10–28 keV.