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Determination of Pb,Zr, Ti,Sr, Cr,Nb and La in lead zirconate titanate ceramics by particle‐induced X‐ray emission
Authors:Rafael Hernández García  Moni Behar  Johnny Ferraz Dias  Margarita Edelia Villanueva Tagle  María Dolores Durruthy Rodríguez  Francisco de Paula Calderón Piñar  Mario Simeón Pomares Alfonso
Institution:1. Laboratorio de Análisis Químico, Instituto de Ciencia y Tecnología de Materiales (IMRE), Universidad de la Habana, , CP, 10400 La Habana, Cuba;2. Laboratório de Implanta??o I?nica, Instituto de Física, Universidade Federal do Rio Grande do Sul, UFRGS, , Porto Alegre, RS, Brazil;3. Departamento de Química General, Facultad de Ciencias Químicas, Universidad de la Habana, , CP, 10400 La Habana, Cuba;4. Departamento de Física Aplicada, Instituto de Cibernética, Matemática y Física CITMA, , CP, 10400 La Habana, Cuba;5. Laboratorio de Magnetismo, Instituto de Ciencia y Tecnología de Materiales, Universidad de La Habana, , CP, 10400 La Habana, Cuba
Abstract:A particle‐induced X‐ray emission (PIXE) technique has been used in the determination of the principal components Pb, Zr and Ti and the substituting elements Sr, Cr, Nb and La in lead zirconate titanate ceramics. In general, precision of analysis was concentration dependent from each element under study. For Pb, precision varied between 0.13% and 0.16%, at higher concentration of 59.32–64.5%. It was around 6–9% for Sr, Cr and Nb at concentrations of 1% or lower. Particular attention was devoted to the estimation of the analysis trueness. With this purpose, three methods were applied: (1) comparison of PIXE and inductively coupled plasma optical emission spectrometry concentrations, (2) recovery study and (3) comparison with a laboratory standard. Trueness of analysis was around 100 ± 10% for the evaluated elements Pb, Zr, Ti, Sr and Cr. The expected stoichiometry and elemental composition homogeneity of a wide group of produced ceramics were confirmed by the PIXE technique. Copyright © 2012 John Wiley & Sons, Ltd.
Keywords:lead zirconate titanate ceramics  elemental determination  PIXE analysis  precision  trueness  ICP‐OES analysis
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