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Epitaxial growth of Ge_(1-x)Sn_x films with x up to 0.14 grown on Ge(00l) at low temperature |
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| Authors: | Tao Ping;Huang Lei;Cheng H H;Wang Huan-Hua;Wu Xiao-Shan |
| Abstract: | |
| Keywords: | GeSn films high resolution X-ray diffraction fully-strained Raman measurements |
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