Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance

Authors:	Gong Jun-Bo, Dong Wei-Le, Dai Ru-Cheng, Wang Zhong-Ping, Zhang Zeng-Ming, Ding Ze-Jun

Abstract:	thin film, optical constants, thickness, copper

Keywords:	thin film optical constants thickness copper
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