Novel frequency dependence of dielectric biaxiality of surface stabilized ferroelectric liquid crystals |
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Authors: | Nobuyuki Itoh Mitsuhiro Koden Shuji Miyoshi Tadashi Akahane |
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Institution: |
a Central Research Laboratories, SHARP Corporation, Nara, Japan
b Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, Niigata, Japan |
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Abstract: | The frequency dependence of the dielectric biaxiality of surface stabilized ferroelectric liquid crystals (SSFLCs) was studied. The principal values of the dielectric tensor ε1, ε2 and ε3 were measured by the MOM (molecular orientational model) method. Three dielectric permittivities were measured for each of two samples. These were the permittivity of the homeotropic cell and the permittivity of the planar homogeneous cell with and without the DC bias. Then the dielectric tensor components were calculated based on the molecular orientational models. We present the theory and experimental procedure of the MOM method. Measurements have been performed on Merck FLC compound SCE-8. The following novel dielectric behaviour was observed, as the DC bias voltage was increased the dielectric permittivity of the planar homogeneous cell decreased at the low frequencies (~ 1 kHz) while increased at the high frequencies (10kHz ~). The sign of the dielectric biaxiality ?εε (= ε2 - ε1) inverted around 1 kHz, being negative at low frequencies and positive at high frequencies. The roles of the biaxiality on the dielectric behaviour of SSFLC cells are discussed. |
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