a LNLS-Laboratório Nacional de Luz Sincrotron, Caixa Postal 6192, 13084–971 Campinas, Sao Paulo, Brazil
b LMCP UMR7590 CNRS, Paris, France
c GEPEEA - CFM, UFSC, SC, Brazil
d Lab. Louis Néel, Grenoble, France
Abstract:
We report here on an X-ray absorption study of La0.7Sr0.3MnO3 films epitaxially grown on SrTiO3 substrate. The local organization around Mn in oriented films with 600 Å in thickness was investigated by polarized Extended X-ray Absorption Fine Structure. The angle between electric field vector and film surface was set equal to 5° and 70° to investigate almost independently the contribution of the manganese neighbors situated in and out of the film plane. The first neighboring shell oxygen is found to be the same in both geometries, but small changes in the next neighboring contribution are observed. These changes are associated with variation in the Mn–Mn bond length. A small in-plane elongation (3%) is observed in the constrained films with respect to the unconstrained case.