Low energy electron diffraction beam profiles and phase transition at Si(111)-7 X 7 surface

Angular profiles of low energy electron diffraction (LEED) beams from Si(111)-7 × 7 are measured for various crystal temperatures T near the phase transition with apparent critical temperature T_c ≈ 1140 K. From analyses of the profiles it is concluded that (1) long range superstructure order persists for T up to at least 50 K above T_c and (2) with increasing T the correlation length characterizing the short-range order peaks for T ≈ T_c ? 100 K and decreases rapidly for T >T_c. Conclusion (1) is discussed with reference to a dislocation network model of Si(111)-7 × 7 reconstruction.