N_2-H_2容性耦合等离子体电非对称效应的particle-in-cell/Monte Carlo模拟

H_2-N_2混合气体电容性耦合射频放电在有机低介电系数材料刻蚀中具潜在研究意义.采用paxticle-incell/Monte Carlo模型模拟了双频(13.56 MHz/27.12 MHz)电压源分别接在结构对称的两个电极上的H_2-N_2容性耦合等离子体特征,研究了其电非对称效应.模拟结果表明,通过调节两谐波间的相位角θ,可以改变其电场、等离子体密度、离子流密度的轴向分布及离子轰击电极的能量分布.当相位角θ为0°时,低频电极(晶片)附近主要离子(H_3~+)的密度最小,离子(H_3~+,H_2~+,H~+)轰击低频电极的流密度及平均能量最高;当θ从0°变化90°时,低频电极的自偏压从-103V到106V近似线性增加,轰击电极的离子流密度变化约±18%,H~+离子轰击低频电极的最大能量约减小2.5倍,轰击电极的平均能量约变化2倍,表明氢离子能量和离子流几乎能独立控制.

Simulations of electrical asymmetry effect on N2-H2 capacitively coupled plasma by particle-in-cell/Monte Carlo model

A N₂-H₂ capacitively coupled rf discharge has potential applications in etching of organic low dielectric constant (low-k) material for microelectronics technology. In this paper, we investigate the characteristic and electrical asymmetry effect (EAE) on the N₂-H₂ capacitively coupled plasma used for low-k material etching by particle-in-cell/Monte Carlo (PIC/MC) model, in which the two frequency sources of 13.56 MHz and 27.12 MHz are applied separately to the two electrodes in geometrically in symmetry. It is found that the plasma density profiles, the ion flux density profiles and the energy distribution of ion bombarding electrodes can be changed by adjusting the phase angle θ between the two harmonics. When the phase angle θ is 0°, the density of primary ion (H₃⁺) near low frequencie electrode (LFE) (wafer) is smallest, whereas flux and average energy of ion (H⁺, H₃⁺, H₂⁺) bombarding LFE are biggest; if the phase angle θ is tuned from 0° to 90°, the dc self-bias increases almost linearly from -103 V to 106 V, ion flux bombarding the LFE decreases by ±18%, the maximum of the ion bombarding energy at the LFE decreases by a factor of 2.5. For the N₂-H₂ capacitively coupled rf discharge, for the case of two frequencies (13.56 MHz/27.12 MHz) applied separately to the two electrodes, can realize separate control of ion energy and flux via the EAE, and is generally in qualitative agreement with experimental and modeling investigation on the Ar and O₂ plasma for a dual-frequency voltage source of 13.56 MHz and 27.12 MHz is applied to the powered electrode. This work supplies a references basis for experimental research and technology that the EAE on the H₂-N₂ plasmas is used for organic low-k material etching process.
Keywords： 2-N₂ plasmas')" href="#">H₂-N₂ plasmas electrical asymmetry effect particle-in-cell/Monte Carlo model