Spectroscopic and atomic force microscopy investigations of hybrid materials composed of fullerenes and 3-aminopropyltrimethoxysilane

Fullerene based materials may open a new horizon in many fields of science. In this study we fabricated thin films of the hybrid materials formed as a result of interactions between C₆₀ fullerenes and 3-aminopropyltrimethoxysilane (APTMS). The deposition technique was a combination of spin-coating and evaporation methods. Interactions within the films were investigated by means of X-ray photoelectron spectroscopy and near edge X-ray absorption fine structure spectroscopy (NEXAFS). Surface morphology was measured by atomic force microscopy (AFM). We found that there are strong chemical reactions between the nucleophilic nitrogen atoms from APTMS and electrophilic fullerene molecules. Results of NEXAFS investigations suggest that due to direct interactions between APTMS and C₆₀ the electronic structure of the fullerene molecules changes while at the same time AFM proved that the C₆₀ molecule diameter is not altered.