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Erratum to: Allan-variance measurements of diode laser frequency-stabilized with a thin vapor cell
Authors:K.?Fukuda  author-information"  >  author-information__contact u-icon-before"  >  mailto:kyo@crl.go.jp"   title="  kyo@crl.go.jp"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,M.?Kinoshita,M.?Tachikawa
Affiliation:(1) Communications Research Laboratory, Applied Research and Standards Division, 4-2-1 Nukuikita-machi, Koganei, 184-8795 Tokyo, Japan;(2) University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, 277-8581 Chiba, Japan;(3) Department of Physics, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki, 214-8571 Kanagawa, Japan
Abstract:A novel method of stabilizing laser frequency that uses a sub-Doppler spectrum of atoms in a thin vapor cell has been developed. The extended-cavity diode laser is frequency-locked to a hyperfine component of the Cs D2 line. The linewidth and the signal-to-noise ratio of the spectrum are systematically investigated to find a cell length that gives best long-term frequency stability. In the Allan-variance measurements on the beat note between two lasers thus stabilized, a frequency stability of 6.2×10-11 is achieved at an averaging time of 5 s. PACS 42.62.Fi, 42.60.Lh, 39.30.+w
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