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Development toward a double focusing isotopic separator for noble gas isotope enrichment |
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| Authors: | Bernard Lavielle Bertrand Thomas Eric Gilabert Gregory Canchel Denis Horlait Sylvain Topin Fabien Pointurier Christophe Moulin |
| Affiliation: | 1. University of Bordeaux, Centre d'Etudes Nucléaires de Bordeaux‐Gradignan, Gradignan Cedex, France;2. CNRS, IN2P3, Centre d'Etudes Nucléaires de Bordeaux‐Gradignan, Gradignan Cedex, France;3. CEA, DAM, DIF, Arpajon, France |
| Abstract: | A double focusing sector field mass filter used in Nier–Johnson geometry has been built in order to perform Kr isotope enrichment for 81Kr and 85Kr isotopes. The principle consists in implanting Kr+ ions accelerated at 7 keV in Al foils after separation using the magnetic sector. A specific ion source has been designed capable of generating high Kr+ ion beams (>0.5 μA) to transfer into the collecting Al foils in 3 to 5 h significant fractions of large Kr samples (1015 to 1016 atoms) initially introduced in the instrument. Implanted Kr isotopes can be further selectively released from the Al foil by surface ablation using an infrared laser beam. Implantation yields and enrichment factors are measured using a conventional mass spectrometer. Copyright © 2016 John Wiley & Sons, Ltd. |
| Keywords: | mass spectrometry noble gases isotope enrichment ion implantation |