电子能谱线形分析研究碳物种的化学状态

利用ＸＰＳ的ＣＩｓ携上峰，Ｘ射线激发供歇线形，ＸＰＳ价带谱以及俄歇电子能谱的ＣＫＬＬ线形研究了几处碳材料的化学状态和电子结构。研究结果表明：ＸＰＳ的携上效应可以鉴别不同结构的碳材料。ＸＡＥＳＲ 化学位移和线形也可以有效地研究中不同的碳材料的成像方式。ＸＰＳ的价带谱电子结构的一种有效方法，对碳材料的研究也很有效。ＡＥＳ的ＣＫＬＬ俄歇线形非常适合金属碳化物的鉴别。

The Chemical States of Carbon Species Studied Using Line Shape Analysis of X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

The chemical states and electronic structure of several carbon materials have been studied using the shake-up peaks of C 1s spectra, the C KLL auger line shapes excited by X-ray, the valence spectra of X-ray photoelectron spectroscopy and the C KLL line shapes of electron induced Auger electron spectroscopy. The results show that the shake-up peaks of C 1s can be used to distinguish the carbon species successfully, and provide chemical bond information. The chemical shift and line shape of X-ray indued Auger electron spectroscopy can distinguish the carbon species and sp2, sp3 hybridized bonds in carbon materials. The valence spectra can provide the messages of valence electron structure, and can also be used to identify the carbon species. The line shape of C KLL is depended on carbon species, which is very useful to identify the metal carbides in the interface reaction combining with depth profile technique of auger electron spectroscopy.