Nonstationary shock models |
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Authors: | M S A-Hameed F Proschan |
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Institution: | Department of Statistics, The Florida State University, Tallahassee, Fla., U.S.A. |
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Abstract: | This paper extends results obtained by Esary, Marshall and Proschan 10]. Life distribution properties of a device subject to shocks governed by a nonhomogeneous Poisson process are related to corresponding properties of the probability of failing after experiencing a given number of shocks. Physically motivated models are analyzed in which shocks cause damage to a set of components, the damages accumulate additively, and when the accumulated damage exceeds a critical threshold (possibly random) for any of the components, the device fails. Bounds are obtained on the moments of the life length of the device. |
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Keywords: | shock models nonhomogenous Poisson process total positivity increasing failure fate new better than used reliability survival probability |
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