| 检测大口径光学平面镜时干涉条纹的子孔径拼接方法 |
| |
| 引用本文： | 杨晓洪,高必烈,崔向群. 检测大口径光学平面镜时干涉条纹的子孔径拼接方法[J]. 光学技术, 2005, 31(4): 611-613 |
| |
| 作者姓名： | 杨晓洪 高必烈 崔向群 |
| |
| 作者单位： | 中国科学院,国家天文台南京天文光学技术研究所,江苏,南京,210042;中国科学院,国家天文台南京天文光学技术研究所,江苏,南京,210042;中国科学院,国家天文台南京天文光学技术研究所,江苏,南京,210042 |
| |
| 摘 要： | 提出了用Ritchey_Common法检测大口径光学平面镜时干涉条纹的子孔径拼接方法。通过确立基准点将多幅子孔径检测数据统一到全口径归一化坐标系下进行拼接,解决了在检验光路中因Ritchey角所引起的投影变形问题和如何消去因被检平面的大曲率所造成的像散。通过Zernike多项式拟合重建连续波面,可恢复全口径波面图像。
|
| 关 键 词： | 干涉条纹的子孔径拼接 Ritchey-Common检测 Zernike多项式 |
| 文章编号： | 1002-1582(2005)04-0611-03 |
| 修稿时间： | 2004-05-21 |
New application of stitching interferometry by using Ritchey-Common method for testing the large aperture optical flat |
| |
| YANG Xiao-hong,GAO Bi-lie,CUI Xiang-qun. New application of stitching interferometry by using Ritchey-Common method for testing the large aperture optical flat[J]. Optical Technique, 2005, 31(4): 611-613 |
| |
| Authors: | YANG Xiao-hong GAO Bi-lie CUI Xiang-qun |
| |
| Abstract: | Based on stitching interferometry, a new application of stitching of interference fringes was discussed by using Ritchey_Common method for testing a large aperture optical flat by means of a small interferometer. Three datum marks were established, and were used to unify all subaperture testing phasic data to a full aperture coordinate system. The distortion of projection produced by Ritchey is resolved angle on testing lightpath, and how to eliminate astigmatism produced by large curvature of the flat for test is resolved. All these subapertures can be connected, and the full aperture wavefront can be reconstructed by means of Zernike coefficients. |
| |
| Keywords: | stitching of interference fringes Ritchey_Common testing Zernike polynomials fit |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
|
