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用不同的Mo靶溅射功率制备Mo/Si多层膜
引用本文:秦俊岭,邵建达,易葵.用不同的Mo靶溅射功率制备Mo/Si多层膜[J].强激光与粒子束,2007,19(1):67-70.
作者姓名:秦俊岭  邵建达  易葵
作者单位:1. 中国科学院 上海光学精密机械研究所, 上海 201800; 2. 中国科学院 研究生院, 北京 100039
基金项目:国家高技术研究发展计划(863计划)
摘    要: 用磁控溅射法制备了周期厚度和周期数均相同的Mo/Si多层膜,用原子力显微镜和小角X射线衍射分别研究了Mo靶溅射功率不相同时,Mo/Si多层膜表面形貌和晶相的变化。随后在国家同步辐射实验室测量了Mo/Si多层膜的软X射线反射率。研究发现,随着Mo靶溅射功率的增大,Mo/Si多层膜的表面粗糙度增加,Mo的特征X射线衍射峰也增强,Mo/Si多层膜的软X射线峰值反射率先增大后减小。

关 键 词:Mo靶  Mo/Si多层膜  溅射功率  软X射线  反射率
文章编号:1001-4322(2007)01-0067-04
收稿时间:2006/6/29
修稿时间:2006-06-29

Mo/Si multilayers prepared with different sputtering power of Mo target
QIN Jun-ling,SHAO Jian-da,YI Kui.Mo/Si multilayers prepared with different sputtering power of Mo target[J].High Power Laser and Particle Beams,2007,19(1):67-70.
Authors:QIN Jun-ling  SHAO Jian-da  YI Kui
Institution:1. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, P.O.Box 800-211, Shanghai 201800, China; 2. Graduate School of Chinese Academy of Sciences, Beijing 100039, China
Abstract:Mo/Si multilayers were prepared by magnetron sputtering.With different sputtering power of Mo target,surface morphology and crystal phases of Mo/Si multilayers were studied by AFM and XRD.Soft X-ray reflectivity of Mo/Si multilayers were measured.As sputtering power of Mo target was increasing,surface roughness of Mo/Si film was increasing,characteristic diffraction peak of Mo species became stronger and stronger,furthermore, soft X-ray peak reflectivity of Mo/Si multilayers first increased and then reduced.
Keywords:Mo target  Mo/Si multilayers  Sputtering power  Soft X-ray  Reflectivity
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