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Near-field optics and control of photonic crystals |
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| Affiliation: | aLaboratory of Physical Chemistry, Swiss Federal Institute of Technology (ETH), CH-8093 Zürich, Switzerland bElectronics Laboratory, Swiss Federal Institute of Technology (ETH), Gloriastrasse 35, CH-8092 Zürich, Switzerland cMax-Planck-Institute of Microstructure Physics, Weinberg 2, D-06120 Halle, Germany dIESL, Foundation for Research and Technology Hellas (FORTH), P.O. Box 1527, 71110 Heraklion, Crete, Greece eDepartment of Physics and CeNS, Ludwig-Maximilians-Universität München, D-80799 Munich, Germany fDepartment of Physics, University of Paderborn, Warburgerstrasse 100, D-33098 Paderborn, Germany gLaboratory for Electromagnetic Fields and Microwave Electronics, Swiss Federal Institute of Technology (ETH), Gloriastrasse 35, CH-8092 Zürich, Switzerland hAmes Laboratory, Iowa State University, Ames, IA 50011, USA iDepartment of Materials Science and Technology, University of Crete, Greece |
| Abstract: | We discuss recent progress and the exciting potential of scanning probe microscopy methods for the characterization and control of photonic crystals. We demonstrate that scanning near-field optical microscopy can be used to characterize the performance of photonic crystal device components on the sub-wavelength scale. In addition, we propose scanning probe techniques for realizing local, low-loss tuning of photonic crystal resonances, based on the frequency shifts that high-index nanoscopic probes can induce. Finally, we discuss prospects for on-demand spontaneous emission control. We demonstrate theoretically that photonic crystal membranes induce large variations in spontaneous emission rate over length scales of 50 nm that can be probed by single light sources, or nanoscopic ensembles of light sources attached to the end of a scanning probe. |
| Keywords: | Photonic crystal Scanning near-field optical microscopy Integrated optics Cavity quantum electrodynamics Spontaneous emission |
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