| 膜去溶-ICP-MS法测定高纯Eu_2O_3中14种痕量稀土杂质 |
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| 引用本文： | 韩国军,伍星,童坚. 膜去溶-ICP-MS法测定高纯Eu_2O_3中14种痕量稀土杂质[J]. 分析试验室, 2009, 28(11) |
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| 作者姓名： | 韩国军 伍星 童坚 |
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| 作者单位： | 北京有色金属研究总院,北京,100088 |
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| 基金项目： | 北京有色金属研究总院青年基金 |
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| 摘 要： | 研究了不需基体分离,膜去溶-ICP-MS法直接测定高纯Eu2O3中的14种痕量稀土杂质的分析方法。讨论了Eu基体产生的多原子离子对被测元素的质谱干扰。使用膜去溶后,待测元素灵敏度提高3倍左右,EuO/Eu产率从去溶前的0.016%降低为0.0007%。建立了Tm的数学校正方程,通过膜去溶结合数学校正可将Eu基体对Tm干扰完全消除。14种稀土杂质的检出限和(∑RE)为70 ng/L,测定下限和(∑RE)为0.54μg/g。对6N高纯Eu2O3样品进行了分析,样品回收率为96%~109%,RSD小于10%。所建立的方法对Eu2O3标准样品的测定结果与国家标准方法测定结果相一致。
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| 关 键 词： | 高纯Eu2O3 膜去溶 数学校正 多原子离子干扰 |
Determination of 14 trace rare earth impurities in high-purity europium oxide by inductively coupled plasma mass spectrometry with membrane desolvation |
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| HAN Guo-jun,WU Xing,TONG Jian. Determination of 14 trace rare earth impurities in high-purity europium oxide by inductively coupled plasma mass spectrometry with membrane desolvation[J]. Chinese Journal of Analysis Laboratory, 2009, 28(11) |
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| Authors: | HAN Guo-jun WU Xing TONG Jian |
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| Affiliation: | HAN Guo-jun,WU Xing and TONG Jian(General Research Institute for Nonferrous Metals,Beijing 100088) |
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| Abstract: | A method for the direct determination of 14 trace rare earth impurities in high purity Eu2O3,without Eu matrix separation,by inductively coupled plasma mass spectrometry with membrane desolvation(MD-ICP-MS) was developed.The mass spectra isobaric interferences of polyatomic ions from Eu matrix to the analytes were discussed.By utilizing membrane desolvation,the sensitivity of the analytes was increased by 3 times approximately and the production ratio of EuO/Eu was reduced from 0.016% to 0.0007%.The algebra... |
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| Keywords: | ICP-MS |
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