Interfacial roughness in a near-critical binary fluid mixture: X-ray reflectivity and near-specular diffuse scattering |
| |
Authors: | BR McClain M Yoon JD Litster SGJ Mochrie |
| |
Institution: | (1) Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139-4307, USA, US |
| |
Abstract: | Measurements are presented of the X-ray specular reflectivity and near-specular diffuse scattering of the interface in a near-critical
mixture of hexane and perfluorohexane. A lineshape analysis of the scattered intensity at each temperature yields values for
the interfacial tension and interfacial width. The temperature variation of the tension and width so-obtained are consistent
with current understanding of this interface, which holds that there is, firstly, an intrinsic width over which the fluid
density varies smoothly from one coexistence composition to the other, and, secondly, that the interface acquires an additional
and larger statistical interfacial width as a result of capillary fluctuations.
Received 1 April 1998 |
| |
Keywords: | PACS 82 70 Dd Colloids - 42 25 Kb Coherence |
本文献已被 SpringerLink 等数据库收录! |
|