| 分子电子器件的电性能测试方法 |
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| 引用本文： | 王伟.分子电子器件的电性能测试方法[J].物理,2007,36(4):288-294. |
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| 作者姓名： | 王伟 |
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| 作者单位： | 清华大学化学系,北京,100084 |
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| 摘 要： | 介绍了用于两端分子电子器件电性能测试的纳米孔技术、交叉线接触技术、导电原子力显微镜技术、扫描隧道显微镜技术、纳米间距电极技术以及机械可控断裂结技术．结合分子器件的电性能测试要求，对各类测试方法进行了分析评价，并简要指出了分子器件电性能测试研究的发展趋势。
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| 关 键 词： | 分子电子学 分子电子器件 电性能测试 |
| 修稿时间： | 2006-03-242006-11-13 |
Measurement of the electrical properties of molecular electronic devices |
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| WANG Wei.Measurement of the electrical properties of molecular electronic devices[J].Physics,2007,36(4):288-294. |
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| Authors: | WANG Wei |
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| Institution: | Department of Chemistry, Tsinghua University, Beijing 100084, China |
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| Abstract: | This paper describes several ways to measure the electrical properties of two - terminal molecular electronic devices, including methods employing nanopores, crossed - wire junctions, conducting atomic force microscopy, scanning tunneling microscopy, nanometer- spaced electrodes and mechanically controllable break junctions. An analysis of these methods based on the test requirements is presented, as well as a brief discussion on new trends in molecular device measurements. |
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| Keywords: | molecular electronics molecular electronic devices electrical properties measurement |
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