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Optical characterization of ferroelectric Bi \mathsf{_{3.25}}La \mathsf{_{0.75}}Ti\mathsf{_{3}}O \mathsf{_{12}} thin films |
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| Authors: | Z G Hu Z M Huang Y N Wu S H Hu G S Wang J H Ma J H Chu |
| Institution: | 1. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, P.R. China |
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