Growth of nano-crystalline metal dots on the Si(1 1 1)-7 × 7 surface saturated with C2H5OH |
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Authors: | Ken-ichi Tanaka Xiaohong Jiang Masayuki Shimojo |
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Affiliation: | Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293, Japan |
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Abstract: | Metal atom on the Si(1 1 1)-7 × 7 surface undergoes migration by hopping among Si-adatom and Si-rest atom. If the hopping migration is prohibited, how change the deposited metals? In this paper, we studied the deposition of metals on the Si(1 1 1)-7 × 7 surface saturated with C2H5OH, on which the whole Si-rest atoms are changed to Si-H so that the hoping migration of metals will be prohibited. We found the growth of ca. 5 nm of crystalline dots by the deposition of Sn, Zn and Ag. Interestingly, Ag dots undergo layer-by-layer growth so that the surface is covered with 5 nm size dots with uniform height. When the hopping migration is prohibited, growth of dots is controlled by the kinetics of precursor state atoms instead of the lattice energy relating to lattice matching or strain. |
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Keywords: | Si(1 1 1)-7 × 7 Si(1 1 1)-7 × 7 saturated with C2H5OH Growth of nano-dot Zn, Sn and Ag Nucleation sites Hopping migration Layer-by-layer growth of nano-dots |
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