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Study for noise reduction in synchrotron radiation based scanning tunneling microscopy by developing insulator-coat tip |
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| Authors: | A. Saito K. Takahashi Y. Takagi K. Hanai Y. Tanaka M. Akai-kasaya S. Shin T. Ishikawa M. Aono |
| Affiliation: | a Department of Material and Life Science, Osaka University, Suita, Osaka 565-0871, Japan b RIKEN SPring-8 Center, RIKEN Harima Institute, Sayo-gun, Hyogo 679-5148, Japan c Nanoscale Quantum Conductor Array Project, ICORP, JST, Saitama 332-0012, Japan d University of Hyogo, Graduate School of Science, LASTI, 3-1-2 Koto, Kamigori, Ako, Hyogo 678-1205, Japan e CREST, Japan Science and Technology Agency, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan f Department of Mathematical Sciences, Osaka Prefecture University, Osaka 599-8531, Japan g PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan h Nanosystem Functionality Center, National Institute for Materials Science, Tsukuba 305-0003, Japan |
| Abstract: | To solve difficulties of instability and inaccuracy in synchrotron radiation based scanning tunneling microscopy, a method to reduce noise was investigated. New insulator-coat tips were developed to shut out electrons coming from a wide area that damage the spatial resolution. By changing the exposed conductive area at the end of the insulator-coat tips, the effect of noise reduction was estimated. The tip with an exposure area of 50 nm in diameter was found to reduce noise effectively. Also a key discriminating condition was found to obtain the local signal, which is based on the modulation of the X-ray-induced tip current caused by excitation of the specific element. |
| Keywords: | Synchrotron radiation Scanning tunneling microscopy Tip Insulator Elemental analysis Si(1 1 1) Ge island Noise reduction |
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