Electric and dielectric properties of solution-gas interface grown amorphous AgCl films |
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Authors: | P S Nikam K A Pathan |
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Institution: | (1) P G Department of Physical Chemistry, M S G College, Malegaon Camp, 423 105, India;(2) Department of Physics, M S G College, Malegaon Camp, 423 105, India |
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Abstract: | Electric and dielectric properties of solution-gas interface grown AgCl thin film capacitors (Al/AgCl/Al) of various thicknesses
have been studied in the frequency range 101–106 Hz at various temperatures (303–393 K). I–V characteristics show ohmic, space-charge-limited, and thermionic emission conduction
mechanisms to operate at low, intermediate and high voltages respectively. Capacitance decreases with increasing film thickness
and applied frequency while it increases with increase of temperature. Loss factor (tanδ), which shows a pronounced minimum with frequency, increases with the rise of temperature and (tanδ)min shifts to a higher frequency. The large values of capacitance and dielectric constant (ɛ) in the low frequency region indicate the possibility of an interfacial polarization mechanism to operate in this region
while electronic and ionic polarizations dominate in the high frequency region. |
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Keywords: | I– V characteristics space charge limited currents thermionic emission capacitance dielectric constants loss factor |
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