X-ray microdiffraction and strain gradient crystal plasticity studies of geometrically necessary dislocations near a Ni bicrystal grain boundary |
| |
Authors: | Tetsuya Ohashi R.I. Barabash J.W.L. Pang G.E. Ice O.M. Barabash |
| |
Affiliation: | 1. Kitami Institute of Technology, Koencho 165, Kitami 090-8507, Japan;2. Oak Ridge National Laboratory, Materials Science and Technology, One Bethel Valley Road, Oak Ridge, TN 37831, USA |
| |
Abstract: | We compare experimental measurements of inhomogeneous plastic deformation in a Ni bicrystal with crystal plasticity simulations. Polychromatic X-ray microdiffraction, orientation imaging microscopy and scanning electron microscopy, were used to characterize the geometrically necessary dislocation distribution of the bicrystal after uniaxial tensile deformation. Changes in the local crystallographic orientations within the sample reflect its plastic response during the tensile test. Elastic strain in both grains increases near the grain boundary. Finite element simulations were used to understand the influence of initial grain orientation and structural inhomogeneities on the geometrically necessary dislocations arrangement and distribution and to understand the underlying materials physics. |
| |
Keywords: | Crystal plasticity Dislocations Grain boundaries Stress relaxation Polycrystalline material |
本文献已被 ScienceDirect 等数据库收录! |