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In situ X-ray diffraction study of germanium at pressures up to 11 GPa and temperatures up to 950 K |
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| Authors: | G.A. Voronin C. Pantea T.W. Zerda L. Wang |
| Affiliation: | a Department of Physics and Astronomy, Texas Christian University, TCU Box 298840, Fort Worth, TX 76129, USA b Center for High Pressure Research and Mineral Physics Institute, State University of New York, Stony Brook, NY 11794-2100, USA c LANSCE, Los Alamos National Laboratory, Los Alamos, NM 87545, USA |
| Abstract: | In situ X-ray diffraction measurements on germanium were conducted in the pressure range of 5-11 GPa and temperatures up to 950 K. Using our data a better defined P-T diagram for germanium is presented. The coordinates of the triple point between GeI-GeII-GeL have been determined to a better degree of precision. The onsets of the GeI-GeII transition were found both under hydrostatic and non-hydrostatic conditions. Anisotropy of thermal expansion coefficient for the GeII is characterized from the c/a ratios in the temperature interval 473-823 K. Phases GeIII and GeIV are shown to be metastable forms of germanium. |
| Keywords: | C. X-ray diffraction C. High pressure |
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