| DA-16晶体管毫伏表元件特性变异所致软故障分析 |
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| 引用本文： | 严梭.DA-16晶体管毫伏表元件特性变异所致软故障分析[J].大学物理实验,2002,15(3):54-55,59. |
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| 作者姓名： | 严梭 |
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| 作者单位： | 武汉工业学院，武汉，430023 |
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| 摘 要： | 本文介绍了晶体元件特性参数变异所致软故障分析判断。
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| 关 键 词： | 晶体管毫伏表 元件 DA 特性参数 分析判断 软故障 体元 |
| 文章编号： | 1007-2934(2002)03-0054-02 |
THE ANALYSIS OF SOFT FAILURE BE CAUSED BY CHARACTERISTIC VARIANCE OF DA-16 TRASISTOR MILIVOLT APPARTUS ELEMENT |
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| Yan Jun.THE ANALYSIS OF SOFT FAILURE BE CAUSED BY CHARACTERISTIC VARIANCE OF DA-16 TRASISTOR MILIVOLT APPARTUS ELEMENT[J].Physical Experiment of College,2002,15(3):54-55,59. |
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| Authors: | Yan Jun |
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| Abstract: | How to analyse and judge the sofrt failure be caused by varance of trasistor characteristic are given. |
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| Keywords: | output characteristic static state method dynamic method soft spoil |
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