X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C60 polymer films |
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| Authors: | M Ramm M Ata T Gross W Unger |
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| Institution: | (1) Sony Corporation Frontier Science Laboratories, 2-1-1, Shinsakuragaoka, Hodogaya-ku, Yokohama-shi 240-0036, Japan (Fax: +81-45/353-6904, E-mail: Matthias.Ramm@jp.sony.com), JP;(2) Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 44-46, 12203 Berlin, Germany, DE |
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| Abstract: | We report core-level and valence-band X-ray photoelectron spectroscopy (XPS) and carbon
]K near-edge X-ray-absorptionfine structure spectroscopy (NEXAFS) results of plasma-polymerized C60. In comparison with evaporated C60 the C 1s peak is broader and asymmetric for the C60 polymer and its shake-up satellites diminished. Furthermore, the features of the valence-band as well as the features of
the π* antibonding orbitals of the C60 polymer are broader and reduced in intensity. Changes in the electronic structure are attributed to the polymerization of
C60, the post-plasma functionalization of the surface by oxygen after exposure to atmosphere, and the occurrence of amorphous
carbon.
Received: 28 May 1999 / Accepted: 31 August 1999 / Published online: 8 March 2000 |
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| Keywords: | PACS: 73 61 Wp 68 35 -p 82 35 +t |
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