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Atomic-resolution structure imaging of defects and interfaces in compound semiconductors
Institution:1. Institute of Ultra High Frequency Semiconductor Electronics of RAS, 117105 Moscow, Russian Federation;2. Alferov University, 194021 St-Petersburg, Russian Federation;3. Saint-Petersburg Scientific Center RAS, 199034 St. Petersburg, Russia;4. Bauman Moscow State Technical University, Moscow 105005, Russian Federation;1. Illinois Institute of Technology, 10W 32nd street, Chicago, IL60616-3793, USA;1. Institute of Physics, Department of Photovoltaics, Technische Universität Ilmenau, Gustav-Kirchhoff-Str. 5, 98693 Ilmenau, Germany;2. Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, 16200 Prague, Czech Republic;3. Institute of Physics, Department of Theoretical Physics, Technische Universität Ilmenau, Weimarer Straße 25, 98693 Ilmenau, Germany;1. Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, USA;2. Analytical Sciences Center, LG Chem Ltd., Daejeon, Republic of Korea
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