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强流短脉冲电子束束剖面的时间分辨测量
引用本文:陈思富, 丁伯南, 夏连胜, 等. 强流短脉冲电子束束剖面的时间分辨测量[J]. 强激光与粒子束, 2002, 14(02).
作者姓名:陈思富  丁伯南  夏连胜  畅理华  章林文  汪伟  李勤
作者单位:1.中国工程物理研究院 流体物理研究所, 四川 绵阳 621 900
摘    要:介绍了一套基于切伦科夫辐射的、用于强流短脉冲电子束束剖面测量的装置。装置利用扫描相机记录背面打毛的石英玻璃薄片中产生的切伦科夫光信号。使用该装置,在中国工程物理研究院流体物理研究所的2MeV注入器上进行了切伦科夫光的验证实验和时间分辨的束剖面测量实验。分析表明,测量系统的时间分辨率和空间分辨率分别为1.75ns和0.74mm。

关 键 词:强流短脉冲电子束   束剖面   切伦科夫辐射   注入器

Time-resolved beam profile measurement of high-current,short pulse electron-beam
chen si-fu, ding bo-nan, xia lian-sheng, et al. Time-resolved beam profile measurement of high-current , short pulse electron-beam[J]. High Power Laser and Particle Beams, 2002, 14.
Authors:chen si-fu  ding bo-nan  xia lian-sheng  chang li-hua  zhang lin-wen  wang wei  li qin
Affiliation:1. Institute of Fluid Physics,CAEP,Sichuan Mianyang 621900,Ch ina
Abstract:A beam profile diagnostic system of high current, short pulse electron based on Cerenkov radiation is introduced. Cerenkov radiation signals produced by thin quartz foil placed in the beam path are detected with streak camera. Experiments confirming Cerenkov radiation and time-resolved beam profile measurement are realized with this system on the 2MeV injector of CAEP. The resolution of the system is estimated to be about 0.74 mm and 1.75ns.
Keywords:high-current  short-pulse electron-beam  beam profile  cerenkov radiation
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