电光采样(EOS)法测量超短电子束束团长度中的模拟计算与误差分析

随着高能物理的发展, 高能量正负电子对撞机, X射线自由电子激光器, 先进的同步光源等, 都需要产生高流强超短脉冲的相对论电子束团. 于是, 亚皮秒电子束束团诊断成为加速器物理新发展的关键技术, 电子束长度的监测是其中的一部分. 电光采样(EOS)法测量超短电子束团长度有非侵入、非破坏、实时测量的特点, 具有较好的应用前景. 本文介绍该方法的原理, 通过模拟计算分析电子束束团与探测光间距、电子束电场与电光晶体晶轴夹角、探测光偏振方向与电光晶体晶轴夹角等实验参数与束团长度测量的关系, 做系统误差分析, 对实际实验有指导意义.

Simulation and Error Analysis of Electro-optic Sampling Measurement of Ultrashort Electron Beam Bunch Length

For the development of high energy physics,it is needed to improve the performance of the relativistic electron bunch.The measurement of the ultrashort relativistic electron pulse becomes one of the key technologies.The electro-optic sampling measurement of relativistic electron pulses is a promising method.This method is nondestructive, non-intrusive,and real-time monitoring.Distance and angles of the reference frames will cause system deviations.In this paper these system deviations are analyzed by simulation.It provides a reference for the experiment.